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Electronics I
Scholar Year: 2019/2020 - 1S
| Code: |
LEEC21113 |
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Acronym: |
ELECT1 |
| Scientific Fields: |
Electrónica e Telecomunicações |
Courses
| Acronym |
N. of students |
Study plan |
Curricular year |
ECTS |
Contact time |
Total Time |
| EEC |
41 |
|
2º |
6,0 |
75 |
162,0 |
Teaching language
Portuguese
Intended learning outcomes (Knowledges, skills and competencies to be developed by the students)
In this curricular unit the basic semiconductor components are studied: Diodes, Bipolar Junction Transistors (BJT) and Field Effect Transistors (MOSFET).
Syllabus
Junction Diodes
Semiconductor concept. Intrinsic and extrinsic semiconductor. PN junction. PN junction not polarized. PN junction directly polarized. Reverse polarization of the PN junction. Conventional sense of voltage and current in the diode. V-I characteristic of the diode. Diode symbols. Linear model by sections, Linear model by simplified sections, Ideal diode model. Diode applications. Dynamic resistance of the diode. Special diodes.
Bipolar Junction Transistor (BJT)
Bipolar junction transistor (BJT). BJT NPN. BJT PNP. The symbology of NPN and PNP transistors. Modes of operation of the transistors: ZAD (Direct Active Zone), ZS (Saturation Zone), ZC (Cut Zone), ZAI (Reverse Active Zone). BJT models for the various modes of operation. Early effect. BJT characteristic curves, Basic BJT assembly configurations and bias. Determination of operating mode. Operating point at rest (Q). BJT as a switch. BJT as an amplifier (C.E). Temperature effect compensation (C.E.). BJT model for small signals in the medium frequencies. The function of coupling and contour capacitors (C.E). Design of polarization circuits.
Transistor Metal Oxide Semiconductor (MOSFET)
Transistor Metal Oxide Semiconductor (MOSFET) channel N. Transistor Metal Oxide Semiconductor (MOSFET) channel P. Characteristic curves of MOSFET. Enrichment and depletion MOSFET. Most used symbologies for FET. Modes of operation of the field effect transistors. MOSFET models for the various modes of operation. Determination of operating mode. Working Point(Q). Polarization circuits. FET as a switch. Design of polarizing circuits. The MOSFET as an amplifier. MOSFET model for small signals in the medium frequencies. A brief reference to the Junction Field Effect Transistor (JFET).
Teaching methodologies
Distributed evaluation without final exam.
Assessment methodologies and evidences
Theoretical Exam, or average of the classifications in two Tests (65%)
Average Laboratory Classifications (35%)
The classification of less than 10 Values in the Examination implies failure in the CU.
The classification of less than 10 values in the laboratory component implies failure in the CU.
Attendance system
To obtain attendance, the student must first prepare each one of five laboratory studies and deliver at the end of each laboratory tables and/or graphs related to the experimental assemblies.
Assement and Attendance registers
| Description |
Type |
Time (hours) |
End Date |
| Attendance (estimated) |
Classes |
45 |
|
| Tests/Exams |
Test/Exam |
4 |
|
| Proposed problems |
Exercise |
12 |
|
| Preparation/Acessessment |
Test/Exam |
8 |
|
| Study/Autonomous Work |
Study |
93 |
|
| |
Total: |
162 |
Primary Bibliography
Robert Boylestad / Louis Nashelsky;Dispositivos Electrónicos e Teoria dos Circuitos. ISBN: 85-216-1195-1 |
Secondary Bibliography
Adel Sedra / Kenneth Smith;Microelectronics Circuits, 1998. ISBN: 0-19-511690-9 |
Manuel de Medeiros Silva;Circuitos com Transistores Bipolares e MOS, Fundação Calouste Gulbenkian. ISBN: 972-31-0840-2 |
Manuel de Medeiros Silva;Introdução aos circuitos eléctricos e electrónicos. ISBN: 972-31-0696-5 |
Observations
Additional information on the assessment components, please consult the course sheet available on the moodle platform.
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